Electron Microscopy - Equipment

The facilitiy is equipped with state-of-the art instrumentation, like embedding automats, ultra-microtomes, cryostats, an automatic freeze substitution unit, a modular high vacuum coating system, critical point dryers and a sputter coater. Electron microscopy is performed with 2 TEMs, a table top SEM and a high resolution cold field emission SEM. 

Examples of sample preparation devices and microscopes: (1) ultramicrotome (Leica UC6) with cryochamber, (2) freeze substitution unit (Leica AFS2), (3) critical-point-dryer (Leica CPD 300), (4) TEM (Jeol JEM 1400Plus, (5) SEM (Jeol JSM 7500F)


Sample preparation

  • Tissue processing automats (Leica EM-TP, Leica EM-AMW)
  • Automated freeze substitution unit (Leica AFS2) for progressive lowering of temperature (PLT) embedding and freeze substitution
  • Knifemaker (Leica EM-KMR)
  • 2 ultramicrotomes (Leica UC6), 1 equipped with a FC6 cryochamber for cryo-ultramicrotomy
  • immunogold labeling automat (Leica IGL, e.g. for serial section analysis, ssTEM)
  • Modular high vacuum coating device (Baltec, Med020, for carbon coating or glow discharging of EM-grids)
  • Epifluorescence dissection microscope (Leica MZ6F, for target preparation)
  • Critical point dryer (Baltec CPD 030, Leica CPD 300) for drying samples for SEM
  • Sputter coater (Baltec SCD 050) for coating dry samples with conductive materials



  • 100 kv Transmission Electron Microscope (FEI Morgagni 268D) with a SIS MegaView III camera
  • 120 kV Transmission Electron Microscope (Jeol JEM 1400 Plus) with a Jeol Ruby camera and the Picture Overlay Program for Correlative Light Electron Microscopy (CLEM)
  • Table top Scanning Electron Microscope (Hitachi TM 1000)
  • Cold Field Emission Scanning Electron Microscope (Jeol JSM-7500F)
  • Epifluorescence widefield microscope (Keyence BZ 8000)